The contrast mechanism of bond defects with the scanning acoustic microscopy

Journal of the Acoustical Society of America

Volumn 104, Issue 5, 1998, Pages 2750-2755

  Wang, Lugen ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC WAVE SCATTERING; BONDING; BOUNDARY CONDITIONS; GREEN'S FUNCTION; INTEGRAL EQUATIONS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SCANNING; SHEAR STRENGTH; TRANSFER FUNCTIONS;

BOND DEFECTS; ELASTIC WAVE SCATTERING; PHASE DIFFERENCE; SCANNING ACOUSTIC MICROSCOPY; SHEAR BOND;

ACOUSTIC IMAGING;

ARTICLE; CALCULATION; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SOLID; TECHNIQUE; VELOCITY;

EID: 0032211631     PISSN: 00014966     EISSN: None     Source Type: Journal    
DOI: 10.1121/1.423859     Document Type: Article

References (11)

1. R. C. Bray, C. F. Quate, and R. Koch, Thin Solid Films 74, 295-301 (1980).
2. R. C. Addison, M. G. Somekh, and G. A. D. Briggs, IEEE Ultrasonics Symposium (IEEE, New York, 1986), pp. 775-795.
3. M. G. Somekh, H. L. Bertoni, G. A. D. Briggs, and N. J. Burton, Proc. R. Soc. London, Ser. A 401, 29-51 (1985).
4. L. M. Brekhovskikh, Waves in Layered Media (Academic, New York, 1960), Chap. 2, pp. 65-80.
5. S. Hirose and M. Kitahara, Review of Progress in Quantitative Nondestructive Evaluation, edited by D. O. Thompson and D. E. Chimenti (Plenum, New York, 1989), Vol. 8A, pp. 47-56.
6. A. Pilarski, Mater. Eval. 43, 765-764 (1985).
7. D. B. Bogy and S. M. Graceski, J. Appl. Mech. 50, 405-412 (1983).
8. Y. C. Lee, J. O. Kim, and J. D. Achenbach, J. Acoust. Soc. Am. 94, 923-925 (1993).
9. G. W. Farnell and E. L. Adler, Physical Acoustic, edited by W. P. Mason and R. N. Thurston (Academic, New York, 1972), Vol. 9, Chap. 2, pp. 110-213.
10. J. Kushibiki, T. Ishikaua, and N. Chubachi, Appl. Phys. Lett. 57, 1967-1971 (1990).
11. G. A. D. Briggs, Acoustic Microscopy (Clarendon, Oxford, 1992), Chap. 12, pp. 260-288.