Refracted near-field measurements of refractive index and geometry of silica-on-silicon integrated optical waveguides

Applied Optics

Volumn 37, Issue 31, 1998, Pages 7268-7272

  Oberson, Philippe ^a   Gisin, Bernard ^a   Huttner, Bruno ^a   Gisin, Nicolas ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; GEOMETRY; INTEGRATED OPTICS; LASER BEAMS; LIGHT REFRACTION; MICROSCOPES; OPACITY; OPTICAL FIBERS; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SILICA; SILICON;

REFRACTED NEAR FIELD MEASUREMENT; SILICA ON SILICON INTEGRATED OPTICAL WAVEGUIDE;

OPTICAL WAVEGUIDES;

EID: 0032209595     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.007268     Document Type: Article

References (12)

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