Ellipsometric microscopy under conditions of surface plasmon resonance

Journal of Optical Technology (A Translation of Opticheskii Zhurnal)

Volumn 65, Issue 11, 1998, Pages 952-953

  Nikitin, A K ^a  

^a PEOPLES FRIENDSHIP UNIVERSITY OF RUSSIA   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; LIGHT INTERFERENCE; RESONANCE; SURFACE WAVES;

ELLIPSOMETRIC MICROSCOPY; SURFACE PLASMON RESONANCE;

OPTICAL MICROSCOPY;

EID: 0032209184     PISSN: 10709762     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)

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