Kinetics of thin-film reactions of nickel oxide with alumina: I, (0001) and {1120} reaction couples

Journal of the American Ceramic Society

Volumn 81, Issue 11, 1998, Pages 2869-2876

  Kotula, Paul G ^a,b,c   Carter, C Barry ^a,b  

^a University of Minnesota   (United States)

^b AMERICAN CERAMIC SOCIETY   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ALUMINA; CRYSTAL GROWTH; CRYSTAL ORIENTATION; DEPOSITION; DIFFUSION IN SOLIDS; FILM GROWTH; INTERFACES (MATERIALS); PULSED LASER APPLICATIONS; REACTION KINETICS; THERMAL EFFECTS; THIN FILMS;

NICKEL ALUMINATE; NICKEL OXIDES; PULSED-LASER DEPOSITION (PLD); SOLID-STATE REACTIONS;

NICKEL COMPOUNDS;

EID: 0032208243     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1998.tb02708.x     Document Type: Article

References (44)

1. 6+x Thin Film-Substrate Interfaces," J. Mater. Res., 4 [5] 1072-81 (1989).
2. 4 as a Novel Substrate for High-Temperature Superconducting Thin Films," Appl. Phys. Lett., 61 [19] 2359-61 (1992).
3. H. Schmalzried, "Solid-State Reactions and the Role of Phase Boundaries," Pol. J. Chem., 67, 167-90 (1993).
4. H. Schmalzried, Chemical Kinetics of Solids. VCH Publishers, New York, 1995.
5. H. Schmalzried, Solid-State Reactions. Verlag Chemie, Weinheim, FRG, 1981.
6. R. E. Carter, "Mechanism of Solid-State Reaction Between Magnesium Oxide and Aluminum Oxide and Between Magnesium Oxide and Ferric Oxide," J. Am. Ceram. Soc., 44 [3] 116-20 (1961).
7. 4 by Solid State Reaction," J. Am. Ceram. Soc., 49 [4] 199-203 (1966).
8. H. Schmalzried, "Solid State Reactions," Ber. Dtsch. Keram. Ges., 42, 11-22 (1965).
9. 2 by Reaction in the Solid State," Z. Phys. Chem., B34 [3-4] 317-21 (1936).
10. C. A. Duckwitz and H. Schmalzried, "Reaktionen Zwischen Festen Oxiden unter Einschluß von Gastransport," Z. Phys. Chem. Neue Folge, 76, 173-93 (1971).
11. H. R. Thirsk and E. J. Whitmore, "An Electron Diffraction Study of the Surface Reaction between Nickel Oxide and Corundum," Trans. Faraday Soc., 36 [1] 565-74 (1940).
12. C. B. Carter and Y. K. Rasmussen, "Growth of Spinel Particles on Alumina Thin Films - I. Orientation Relationships and Shape of the Particles," Acta Metall. Mater. 42 [8] 2729-40 (1994).
13. C. B. Carter and Y. K. Rasmussen, "Growth of Spinel Particles on Alumina Thin Films - II. Morphology and Crystallography of the Interface," Acta Metall. Mater., 42 [8] 2741-52 (1994).
14. 3 Reaction Couples Prepared by CVD," Scr. Metall., 22 [7] 1149-54 (1988).
15. 4 Spinel Formation," Philos. Mag., 65 [2] 403-25 (1992).
16. P. G. Kotula and C. B. Carter, "Volume Expansion and Lattice Rotations in Solid State Reactions," Scr. Metall. Mater., 32 [6] 863-66 (1995).
17. P. G. Kotula, "Ceramic Thin-Film Reactions: Nucleation and Kinetics"; Ph.D. Thesis. University of Minnesota, Minneapolis, MN, 1995.
18. Y. K. Simpson, E. G. Colgan, and C. B. Carter, "Kinetics of the Growth of Spinel on Alumina Using Rutherford Backscattering Spectroscopy," J. Am. Ceram. Soc., 70 [7] C-149-C-151 (1987).
19. Y. K. Simpson, "Grain Boundaries, Phase Boundaries and Reactions in Ceramic Oxides"; Ph.D. Thesis. Cornell University, Ithaca, NY, 1989.
20. 3 (1120) Substrates," Surf. Sci., 329, 227-40 (1995).
21. G. de Roos, J. W. Geus, J. M. Fluit, and J. H. de Wit, "Investigation of the Solid-State Reaction Between Nickel Oxide and Alumina by Rutherford Backscattering (RBS)," Nucl. Instrum. Methods, 168, 485-89 (1980).
22. 3 Studied by Rutherford Backscattering," Surf. Interface Anal., 3 [5] 229-34 (1981).
23. 4"; in Proceedings of the Second European Conference on Solid State Chemistry (Veldhoven, The Netherlands). Edited by R. Metselaar, H. J. M. Heijligers, and J. Schoonman. Elsevier Scientific Publishing, Amsterdam, The Netherlands, 1982.
24. 4 by Rutherford Backscattering," Surf. Interface Anal., 5 [3] 119-31 (1983).
25. 3 Substrate on the Solid State Reaction with a Layer of NiO: A Comparative Backscattering Spectrometry Study I," Surf. Interface Anal., 5 [4] 167-69 (1983).
26. L. R. Doolittle, "Algorithms for the Rapid Simulation of Rutherford Backscattering Spectra," Nucl. Instrum. Methods, Phys. Res. Sect. B, 9, 344-51 (1985).
27. 3," J. Am. Ceram. Soc., 57 [8] 363-67 (1974).
28. Y. K. Simpson, "Kinetics of the Growth of Spinel Using RBS in Grain Boundaries, Phase Boundaries and Reactions in Ceramic Oxides"; Ch. 4. Ph.D. Thesis. Cornell University, Ithaca, NY, 1989.
29. K. D. Becker, "Spectroscopic Studies of Phase Formation and Diffusion Processes at Interfaces," Mater. Sci. Forum, 155-156, 71-90 (1994).
30. T. He, "UV-VIS-NIR Spectroscopie an Übergangsmetalloxiden bei Hohen Temperaturen"; Doktor Naturwissenschaften Thesis. Universität Hannover, Hannover, Germany, 1993.
31. H. G. Sockel and H. Schmalzried, "The Role of Phase Boundaries During Reaction Between Single Crystals of Various Oxides," Mater. Sci. Res., 3, 61-73 (1966).
32. 3," Philos. Mag., 52, 207-24 (1985).
33. P. G. Kotula and C. B. Carter, "Interfacial Control of Reaction Kinetics in Oxides," Phys. Rev. Lett., 77 [16] 3367-70 (1996).
34. P. G. Kotula and C. B. Carter, "Solid-State Reactions Using Films Deposited by Pulsed-Laser Ablation"; pp. 231-36 in Proceedings of the 2nd International Conference on Laser Ablation, Vol. 288 (Knoxville, TN). Edited by J. C. Miller and D. B. Geohegan. American Institute of Physics, Knoxville, TN, 1993.
35. 3 Before and After Heat Treatment"; pp. 1120-21 in Proceedings of the 51st Annual Meeting of the Microscopy Society of America (MSA) (Cincinnati, OH). Edited by G. W. Bailey and C. L. Reider. San Francisco Press, San Francisco, CA, 1993.
36. 3," J. Am. Ceram. Soc., 78 [1] 248-50 (1995).
37. D. W. Susnitzky and C. B. Carter, "Surface Morphology of Heat-Treated Ceramic Thin Films," J. Am. Ceram. Soc., 75 [9] 2463-78 (1992).
38. M. G. Norton, S. R. Summerfelt, and C. B. Carter, "Surface Preparation for the Heteroepitactic Growth of Ceramic Thin Films," Appl. Phys. Lett., 56 [22] 2246-48 (1990).
39. S. J. Klepeis, J. P. Benedict, and R. M. Anderson, "A Grinding/Polishing Tool for TEM Sample Preparation," Mater. Res. Soc. Symp. Proc., 115, 179-83 (1988).
40. R. Autrata and J. Hejna, "Detectors for Low Voltage Scanning Electron Microscopy," Scanning, 13, 275-87 (1991).
41. S. L. Erlandsen, P. Telega, E. Chi, W. Dobson, and E. Egelman, "Digital Image Acquisition for the Hitachi S-900 Field-Emission SEM"; pp. 1034-35 in Proceedings of the 52nd Annual Meeting of the Microscopy Society of America (MSA) (New Orleans, LA). Edited by G. W. Bailey and A. J. Garratt-Reed. San Francisco Press, San Francisco, CA, 1994.
42. W. Rasband, NIH-Image. National Institute of Health, Bethesda, MD.
43. P. G. Kotula and C. B. Carter, "The Measurement of Thin-Film Reaction Layers with High-Resolution FESEM"; pp. 330-31 in Proceedings of Microscopy and Microanalvsis '95 (Kansas City, MO). Edited by G. W. Bailey, M. H. Ellisman, R. A. Hennigar, and N. J. Zaluzec. Jones and Begell, Kansas City, MO, 1995.
44. J. J. Hornstra, "Dislocations, Stacking Faults and Twins in the Spinel Structure," Phys. Chem. Solids, 15, 311-23 (1960).