The semivariogram in comparison to the co-occurrence matrix for classification of image texture

IEEE Transactions on Geoscience and Remote Sensing

Volumn 36, Issue 6, 1998, Pages 1945-1952

  Carr, James R ^a   De Miranda, Fernando Pellon ^a  

^a UNIVERSITY OF NEVADA   (United States)

Author keywords

Correlation; Covariance analysis; Image classification; Image texture analysis; Pattern classification

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; MATRIX ALGEBRA; MICROWAVE DEVICES; PATTERN RECOGNITION; RADAR IMAGING;

CO-OCCURRENCE MATRIX; COVARIANCE ANALYSIS; IMAGE TEXTURE ANALYSIS; SEMIVARIOGRAM FUNCTIONS;

REMOTE SENSING;

EID: 0032208030     PISSN: 01962892     EISSN: None     Source Type: Journal    
DOI: 10.1109/36.729366     Document Type: Article

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