A new technique for characterization of pore structures in materials - Application to the study of hydroxyapatite thin films

Materials Letters

Volumn 37, Issue 4-5, 1998, Pages 211-214

  Lopatin, C M ^a   Alford, T L ^a   Pizziconi, V B ^a   Laursen, T ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b Silicon Wafer Group   (United States)

Author keywords

Bioceramic; Hydroxyapatite; Ion implantation; Porosity; Rutherford backscattering spectrometry; Thin films

Indexed keywords

ION IMPLANTATION; PORE SIZE; POROSITY; POROUS MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SOL-GELS; THIN FILMS;

HYDROXYAPATITE;

PHOSPHATE MINERALS;

EID: 0032208029     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(98)00093-7     Document Type: Article

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7. C.M. Lopatin, T.L. Alford, V.B. Pizziconi, T. Laursen, to be published.