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Volumn 145, Issue 3, 1998, Pages 434-448

A method for forward energy-dispersive X-ray fluorescence analysis of thin and intermediate samples

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; FLUORESCENCE; LIGHT ABSORPTION;

EID: 0032207626     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00418-2     Document Type: Article
Times cited : (6)

References (11)
  • 4
    • 0043008610 scopus 로고
    • Quantification in XRF analysis of intermediate-thickness samples
    • R. Van Grieken, A. Markowicz (Eds.), Marcel Dekker, New York
    • A. Markowicz, R. Van Grieken, Quantification in XRF analysis of intermediate-thickness samples, in: R. Van Grieken, A. Markowicz (Eds.), Handbook on X-Ray Spectrometry: Methods and Techniques, Marcel Dekker, New York, 1992, pp. 339-357.
    • (1992) Handbook on X-Ray Spectrometry: Methods and Techniques , pp. 339-357
    • Markowicz, A.1    Van Grieken, R.2
  • 6
    • 77956960608 scopus 로고
    • Photon induced X-ray emission
    • R. Cesareo (Ed.), Elsevier, Amsterdam, New York, Tokio
    • R. Cesareo, Photon induced X-ray emission, in: R. Cesareo (Ed.), Nuclear Analytical Techniques in Medicine, Elsevier, Amsterdam, New York, Tokio 1988.
    • (1988) Nuclear Analytical Techniques in Medicine
    • Cesareo, R.1
  • 9
    • 0347988748 scopus 로고    scopus 로고
    • AMPTEK Inc., Bedford, MA 01730-2204, USA
    • AMPTEK Inc., Bedford, MA 01730-2204, USA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.