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Physica C: Superconductivity and its Applications

Volumn 308, Issue 1-2, 1998, Pages 16-20

Correlation between the microwave surface resistance and the volumic fraction of a-axis grains in YBa2Cu3O7-x films

(6) Dubourdieu, C a,c Senateur J P a Thomas, O a,d Weiss, F a Hensen, S b Muller G b

a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE (France)

b UNIVERSITY OF WUPPERTAL (Germany)

c Grenoble INP Phelma (France)

d AIX MARSEILLE UNIVERSITY (France)

Author keywords

Grain boundaries; Microwave absorption; Surface impedance; Thin films

Indexed keywords

ELECTRIC RESISTANCE; ELECTROMAGNETIC WAVE ABSORPTION; EPITAXIAL GROWTH; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROWAVES; OXIDE SUPERCONDUCTORS; PRESSURE EFFECTS; SURFACE PROPERTIES; VOLUME FRACTION; YTTRIUM BARIUM COPPER OXIDES;

MICROWAVE SURFACE RESISTANCE;

SUPERCONDUCTING FILMS;

EID: 0032207235 PISSN: 09214534 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4534(98)00539-5 Document Type: Article

Times cited : (8)

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