Detectability of mis-oriented defects by ultrasonic examinations - a few observations

Insight: Non-Destructive Testing and Condition Monitoring

Volumn 40, Issue 11, 1998, Pages 766-768

  Thavasimuthu, M ^a   Hemamalini, R ^a   Subramanian, C V ^a   Jayakumar, T ^a   Kalyanasundaram, P ^a   Raj, Baldev ^a  

^a Metallurgy and Materials Group   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; PROBES; SPURIOUS SIGNAL NOISE; SURFACE ROUGHNESS;

ULTRASONIC FLAW DETECTORS;

ULTRASONIC TESTING;

EID: 0032207211     PISSN: 13542575     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)