Growth mechanism of biaxially textured YSZ films deposited by ion-beam-assisted deposition

Journal of Materials Research

Volumn 13, Issue 11, 1998, Pages 3149-3152

  Wiesmann, J ^a   Dzick, J ^a   Hoffmann, J ^a   Heinemann, K ^a   Freyhardt, H C ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; EPITAXIAL GROWTH; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; ION BEAMS; NUCLEATION; TEXTURES; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

DIFFUSION BARRIERS; ION BEAM ASSISTED DEPOSITION; TEXTURE QUALITY; YTTRIA-STABILIZED ZIRCONIA;

ZIRCONIA;

EID: 0032206610     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0428     Document Type: Article

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