Thin-film chemical sensors with waveguide Zeeman interferometry

Pure and Applied Optics (Print edition) (United Kingdom)

Volumn 7, Issue 6, 1998, Pages 1261-1271

  Ayras P ^a   Honkanen, S ^a   Grace, K M ^b   Shrouf, K ^b   Katila, P ^c   Leppihalme, M ^c   Tervonen, A ^d   Yang, X ^b   Swanson, B ^b   Peyghambarian, N ^a  

^a UNIVERSITY OF ARIZONA   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

^d NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ZEEMAN INTERFEROMETRY;

INTERFEROMETRY; THIN FILM DEVICES; TOLUENE; WAVEGUIDES;

CHEMICAL SENSORS;

EID: 0032205470     PISSN: 09639659     EISSN: None     Source Type: Journal    
DOI: 10.1088/0963-9659/7/6/006     Document Type: Article

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