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Volumn 30, Issue 13, 1998, Pages 979-982
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Special panel session for feature recognition at the 1997 ASME Computers in Engineering Conference
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Author keywords
Feature recognition; Process planning
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Indexed keywords
ALGORITHMS;
BENCHMARKING;
COMPUTER AIDED ENGINEERING;
COMPUTER AIDED MANUFACTURING;
COMPUTER INTEGRATED MANUFACTURING;
FEATURE EXTRACTION;
MANUFACTURING DATA PROCESSING;
PROCESS ENGINEERING;
STRATEGIC PLANNING;
COMPUTER AIDED PROCESS PLANNING (CAPP);
COMPUTER AIDED DESIGN;
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EID: 0032203894
PISSN: 00104485
EISSN: None
Source Type: Journal
DOI: 10.1016/S0010-4485(98)00057-8 Document Type: Article |
Times cited : (12)
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References (3)
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