Analysis of artifacts in infrared spectroscopy of thin organic films on metallic substrates

Langmuir

Volumn 14, Issue 24, 1998, Pages 6987-6991

  Kurth, Dirk G ^a  

^a MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; INFRARED SPECTROSCOPY; REFRACTIVE INDEX; SUBSTRATES; SURFACE CLEANING;

REFLECTION-ABSORPTION INFRARED (RAIR) SPECTROSCOPY;

THIN FILMS;

EID: 0032203729     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970903e     Document Type: Article

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