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Volumn 33, Issue 6, 1998, Pages 1763-1765
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An improved probability function to predict the F1 layer occurrence and L condition
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA PROCESSING;
FORECASTING;
IMPROVEMENT;
PROBABILITY DENSITY FUNCTION;
TESTING;
ELECTRON DENSITY;
F REGION;
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EID: 0032202861
PISSN: 00486604
EISSN: None
Source Type: Journal
DOI: 10.1029/98RS02637 Document Type: Article |
Times cited : (9)
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References (2)
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