Seal identification using the Delaunay tessellation

Proceedings of the National Science Council, Republic of China, Part A: Physical Science and Engineering

Volumn 22, Issue 6, 1998, Pages 751-757

  Chiang, Yi Wu J ^a   Wang, Rui Ching ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; GEOMETRY; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE SEGMENTATION;

DELAUNAY TESSELLATION; SEAL RECOGNITION;

PATTERN RECOGNITION;

EID: 0032202641     PISSN: 02556588     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)