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Volumn 9, Issue 4, 1998, Pages 391-398

Neural network approach to crack identification

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; CONDUCTIVE MATERIALS; CRACKS; FEEDFORWARD NEURAL NETWORKS; IDENTIFICATION (CONTROL SYSTEMS); MATHEMATICAL MODELS; MULTILAYER NEURAL NETWORKS; TRANSDUCERS;

EID: 0032188617     PISSN: 13835416     EISSN: None     Source Type: Journal    
DOI: 10.3233/jae-1998-119     Document Type: Article
Times cited : (9)

References (4)
  • 2
    • 3643051432 scopus 로고
    • Defects investigation in conducting sheets by eddy current method
    • in Polish
    • R. Sikora, M. Komorowski and T. Chady, Defects investigation in conducting sheets by eddy current method, Internal report, 1994 (in Polish).
    • (1994) Internal Report
    • Sikora, R.1    Komorowski, M.2    Chady, T.3
  • 4
    • 2542460681 scopus 로고
    • Warsaw University of Technology
    • S. Osowski, Neural Networks, Warsaw University of Technology, 1994.
    • (1994) Neural Networks
    • Osowski, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.