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Volumn 13, Issue 4, 1998, Pages 1461-1467

Experimental investigation of voltage sag mitigation by an advanced static var compensator

Author keywords

Advanced Static Var Compensator; Voltage Sag; Voltage Sag Mitigation

Indexed keywords

CAPACITANCE; ELECTRIC IMPEDANCE; MODELS; VOLTAGE REGULATORS;

EID: 0032187358     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/61.714772     Document Type: Article
Times cited : (71)

References (8)
  • 2
    • 19644369103 scopus 로고    scopus 로고
    • Analysis and Consequences of Phase Jump Associated with a Voltage Sag
    • Dresden, Germany, August
    • M.H.J. Bollen, P. Wang, N. Jenkins, "Analysis and Consequences of Phase Jump Associated with A Voltage Sag", Proceedings of PSCC, Dresden, Germany, August, 1996
    • (1996) Proceedings of PSCC
    • Bollen, M.H.J.1    Wang, P.2    Jenkins, N.3
  • 4
    • 0028407002 scopus 로고
    • Description of Micro-SMES System for Protection of Critical Customer Facilities
    • April
    • J. Lamoree, L. Tang, C. Dewinkel, P. Vinett, "Description of Micro-SMES System for Protection of Critical Customer Facilities", IEEE Trans on Power Delivery, Vol. 9, No. 2, April 1994
    • (1994) IEEE Trans on Power Delivery , vol.9 , Issue.2
    • Lamoree, J.1    Tang, L.2    Dewinkel, C.3    Vinett, P.4
  • 7
    • 0030286602 scopus 로고    scopus 로고
    • Fast Assessment Methods for Voltage Sags in Distribution Systems
    • Nov/Dec
    • M.H.J. Bollen, "Fast Assessment Methods for Voltage Sags in Distribution Systems", IEEE Transactions on Industry Applications, Vol.32, No. 6, pp1414-1423, Nov/Dec 1996
    • (1996) IEEE Transactions on Industry Applications , vol.32 , Issue.6 , pp. 1414-1423
    • Bollen, M.H.J.1
  • 8
    • 0018493008 scopus 로고
    • Diagnosing Power Quality-related Computer Problems
    • July/August
    • T.S. Key, "Diagnosing Power Quality-related Computer Problems", IEEE Transactions on Industry Applications, Vol. 15, No.4, July/August 1979
    • (1979) IEEE Transactions on Industry Applications , vol.15 , Issue.4
    • Key, T.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.