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Volumn 253, Issue 1-2, 1998, Pages 123-130

DLTS study of nucleation stage of oxygen precipitate in silicon

Author keywords

Nucleation; Oxygen precipitates; Silicon

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; DEEP LEVEL TRANSIENT SPECTROSCOPY; NUCLEATION; OXYGEN; PHASE TRANSITIONS; PRECIPITATION (CHEMICAL);

EID: 0032187352     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)00371-8     Document Type: Article
Times cited : (4)

References (23)
  • 9
    • 0002008981 scopus 로고
    • H.R. Huff, T. Abe, B.O. Kolbesen (Eds.), the Electrochemical Society, Pennington
    • H. Harada, T. Abe, J. Chikawa, in: H.R. Huff, T. Abe, B.O. Kolbesen (Eds.), Semiconductor Silicon, the Electrochemical Society, Pennington, 1989, p. 76.
    • (1989) Semiconductor Silicon , pp. 76
    • Harada, H.1    Abe, T.2    Chikawa, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.