Superlattice Structures in Poly(phenylenevinylene)-Based Self-Assembled Films

Advanced Materials

Volumn 10, Issue 14, 1998, Pages 1104-1108

  Hong, Haiping ^a   Steitz, Roland ^b,c   Kirstein, Stefan ^d   Davidov, Dan ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b HAHN MEITNER INSTITUT   (Germany)

^c TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^d MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE PLASTICS; LIGHT EMITTING DIODES; MOLECULAR STRUCTURE; NEUTRON REFLECTION; PLASTIC FILMS; SEMICONDUCTOR DEVICE MANUFACTURE; SUPERLATTICES; SURFACE ROUGHNESS; SYNTHESIS (CHEMICAL);

BRAGG REFLECTIONS; DECHER METHOD; POLYPHENYLENE VINYLENE;

VINYL RESINS;

EID: 0032184374     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4095(199810)10:14<1104::AID-ADMA1104>3.0.CO;2-F     Document Type: Article

References (20)

1. G. Decher, J. D. Hong, Makromol. Chem. 1992, 46, 321.
2. G. Decher, J. D. Hong, J. Schmitt, Thin Solid Films 1992, 210, 831.
3. A. C. Fou, O. Onitsuka, M. Ferreira, M. F. Rubner, J. Appl. Phys. 1996, 79, 7501. O. Onitsuka, A. C. Fou, M. Ferreia, B. R. Hsieh, M. F. Rubner, J. Appl. Phys. 1996, 80, 4067.
4. A. C. Fou, O. Onitsuka, M. Ferreira, M. F. Rubner, J. Appl. Phys. 1996, 79, 7501. O. Onitsuka, A. C. Fou, M. Ferreia, B. R. Hsieh, M. F. Rubner, J. Appl. Phys. 1996, 80, 4067.
5. J. Tian, C. C. Wu, M. E. Thompson, J. C. Sturm, R. A. Register, Chem. Mater. 1995, 7, 2190.
6. M. Gao, B. Richter, S. Kirstein, Adv. Mater. 1997, 9, 802.
7. M. Onoda, H. Nakayama, T. Yamaue, K. Tada, K. Yoshino, Jpn. J. Appl. Phys. 1997, 36, 5322.
8. H. Hong, Y. Avny, D. Davidov, H. Chayet, E. Faraggi, R. Neumann, Adv. Mater. 1995, 10, 846. H. Hong, E. Z. Faraggi, M. Tarabia, H. Chayet, D. Davidov, Y. Avny, R. Neumann, S. Kirstein, J. Appl. Phys. 1996, 79, 3082. H. Hong, D. Davidov, M. Tarabia, H. Chayet, I. Benjamin, E. Z. Faraggi, Y. Avny, R. Neumann, Synth. Met. 1997, 85, 1265.
9. H. Hong, Y. Avny, D. Davidov, H. Chayet, E. Faraggi, R. Neumann, Adv. Mater. 1995, 10, 846. H. Hong, E. Z. Faraggi, M. Tarabia, H. Chayet, D. Davidov, Y. Avny, R. Neumann, S. Kirstein, J. Appl. Phys. 1996, 79, 3082. H. Hong, D. Davidov, M. Tarabia, H. Chayet, I. Benjamin, E. Z. Faraggi, Y. Avny, R. Neumann, Synth. Met. 1997, 85, 1265.
10. H. Hong, Y. Avny, D. Davidov, H. Chayet, E. Faraggi, R. Neumann, Adv. Mater. 1995, 10, 846. H. Hong, E. Z. Faraggi, M. Tarabia, H. Chayet, D. Davidov, Y. Avny, R. Neumann, S. Kirstein, J. Appl. Phys. 1996, 79, 3082. H. Hong, D. Davidov, M. Tarabia, H. Chayet, I. Benjamin, E. Z. Faraggi, Y. Avny, R. Neumann, Synth. Met. 1997, 85, 1265.
11. M. Tarabia, H. Hong, D. Davidov, S. Kirstein, R. Steitz, R. Neumann, Y. Avny, J. Appl. Phys. 1998, 83, 725.
12. Z. Shen, S. R. Forrest, Phys. Rev. B 1997, 57, 10 578.
13. Y. Ohmori, A. Fujii, M. Uchida, C. Morishima, K. Yoshino, Appl. Phys. Lett. 1993, 62, 3250.
14. H. Hong, D. Davidov, H. Chayet, E. Z. Faraggi, M. Tarabia, Y. Avny, R. Neumann, S. Kirstein, Supermol. Sci. 1997, 4, 67.
15. B. E. A. Saleh, M. C. Teich, Fundamentals of Photonics, Wiley, New York 1991.
16. L. G. Parrat, Phys. Rev. 1954, 95, 359.
17. L. Nevot, P. Croce, Rev. Phys. Appl. 1980, 15, 761.
18. For example, the change of one individual layer thickness by 10 % leads to significant changes in the pattern of Kiessig oscillations between the Bragg peaks.
19. G. B. Sukhorukov, J. Schmitt, G. Decher, Ber. Bunsenges. Phys. Chem. 1996, 100, 948.
20. F. Mezei, R. Goloub, F. Klose, H. Toews, Physica B 1995, 213/214, 898.