Investigation of strong electric-field induced surface phenomena by soft X-UV laser interferometry

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 416, Issue 1, 1998, Pages 189-191

  Zeitoun, Ph ^a   Albert, F ^a   Jaegle P ^a   Joyeux, D ^a   Boussoukaya, M ^a,b   Carillon, A ^a   Hubert, S ^a   Jamelot, G ^a   Klisnick, A ^a   Phalippou, D ^a   Lagron, J C ^a   Ros, D ^a   Sebban, S ^a   Zeitoun Fakiris, A ^b  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b CEA SACLAY   (France)

Author keywords

Electric field; Interferometry; Surface morphology; X ray laser

Indexed keywords

ELECTRIC FIELD EFFECTS; INTERFEROMETRY; LASER APPLICATIONS; SURFACE PHENOMENA; TRANSIENTS; ULTRAVIOLET RADIATION; X RAYS;

LASER INTERFEROMETRY;

NIOBIUM;

EID: 0032184242     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)00753-0     Document Type: Article

References (8)

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