Detecting and identifying spectral anomalies using wavelet processing

Applied Spectroscopy

Volumn 52, Issue 10, 1998, Pages 1348-1352

  Stork, Chris L ^a   Veltkamp, David J ^a   Kowalski, Bruce R ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Disturbance identification; MSPC; PCA; Signal localization; Wavelet transform

Indexed keywords

INFRARED SPECTROSCOPY; MATHEMATICAL MODELS; SIGNAL DETECTION; STATISTICAL PROCESS CONTROL; WAVELET TRANSFORMS;

MULTIVARIATE STATISTICAL PROCESS CONTROL (MSPC); PRINCIPAL COMPONENT ANALYSIS (PCA); SPECTRAL ANOMALIES;

SPECTRUM ANALYSIS;

EID: 0032184057     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702981942681     Document Type: Article

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