Thermal stability of nanocrystalline gold studied by X-ray diffraction method

Materials Transactions, JIM

Volumn 39, Issue 10, 1998, Pages 1029-1032

  Inami, Takashi ^a   Okuda, Shigeo ^a,c   Maeta, Hiroshi ^b   Ohtsuka, Hideo ^b  

^a IBARAKI UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Gas deposition method; Gold; Grain growth; Grain size; Nanocrystal; Thermal stability; X ray diffraction

Indexed keywords

ANNEALING; DEPOSITION; EVAPORATION; GRAIN GROWTH; GRAIN SIZE AND SHAPE; HELIUM; NANOSTRUCTURED MATERIALS; SIZE DETERMINATION; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

GAS DEPOSITION METHOD; WARREN-AVERBACH'S METHOD;

GOLD;

EID: 0032183382     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.39.1029     Document Type: Article

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