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Volumn 35, Issue 1-2, 1998, Pages 49-52

On Line Surface Roughness Measurements Using Image Processing Towards an Adaptive Control

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE CONTROL SYSTEMS; COMPUTER VISION; DATA REDUCTION; IMAGE PROCESSING; MACHINING; ONLINE SYSTEMS; ROUGHNESS MEASUREMENT;

EID: 0032183064     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0360-8352(98)00017-5     Document Type: Article
Times cited : (49)

References (2)
  • 1
    • 0023347019 scopus 로고
    • Surface Roughness Measurement Using Scanning Electron Microscope with Digital Processing
    • Transaction, May
    • Sato, H and O-hori, M., "Surface Roughness Measurement Using Scanning Electron Microscope with Digital Processing." Transaction or the ASME Journal of Engineering for Industry vol. 109, May 1987 pp 106-111
    • (1987) ASME Journal of Engineering for Industry , vol.109 , pp. 106-111
    • Sato, H.1    O-hori, M.2
  • 2
    • 0026866188 scopus 로고
    • A Possibility of 1/f Evaluation on Surface Finishes Based on Fluctuation Behavior
    • Transaction, May
    • Shiraishi, M. "A Possibility of 1/f Evaluation on Surface Finishes Based on Fluctuation Behavior", Transaction of ASME, Journal of Engineering for Industry, May 1992,Vol. 114, pp 207-212
    • (1992) ASME, Journal of Engineering for Industry , vol.114 , pp. 207-212
    • Shiraishi, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.