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Volumn 416, Issue 3, 1998, Pages 384-395

A quantitative LEED analysis of the oxygen-induced p(3 x 1) reconstruction of Pt25Rh75(100)

Author keywords

Alloys; Low energy electron diffraction (LEED); Platinum; Rhodium; Scanning tunneling microscopy; Surface relaxation and reconstruction; Surface segregation

Indexed keywords

ANNEALING; CHEMICAL BONDS; GAS ADSORPTION; LOW ENERGY ELECTRON DIFFRACTION; OXYGEN; RELAXATION PROCESSES; RHODIUM; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

EID: 0032182519     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00574-3     Document Type: Article
Times cited : (18)

References (30)
  • 14
    • 0003649718 scopus 로고
    • V.I. Goldanskii, R. Gomer, F.P. Schäfer, J.P. Toennis (Eds.), Springer Series in Chemical Physics, Springer, Berlin
    • M.A. Van Hove, S.Y. Tong, in: V.I. Goldanskii, R. Gomer, F.P. Schäfer, J.P. Toennis (Eds.), Surface Crystallography by LEED, Springer Series in Chemical Physics, Springer, Berlin, 1979.
    • (1979) Surface Crystallography by LEED
    • Van Hove, M.A.1    Tong, S.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.