Repetitive testing strategies when the testing process is imperfect

Management Science

Volumn 44, Issue 10, 1998, Pages 1367-1378

  Ding, Jie ^a   Greenberg, Betsy S ^a   Matsuo, Hirofumi ^a  

^a NONE

Author keywords

Computer Electronic Industry; Inspection; Optimal Testing Strategies; Semiconductor Manufacturing

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; ELECTRONICS INDUSTRY; INSPECTION; PRODUCTION; QUALITY ASSURANCE; SUPERVISORY PERSONNEL;

COMPUTER INDUSTRY; OPTIMAL TESTING STRATEGIES; REPETITIVE TESTING STRATEGIES;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0032182286     PISSN: 00251909     EISSN: None     Source Type: Journal    
DOI: 10.1287/mnsc.44.10.1367     Document Type: Article

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