Surface electromagnetic waves in near-field optical scanning microscopy

Optics Communications

Volumn 155, Issue 4-6, 1998, Pages 351-360

  Pascual, M F ^a   Zierau, W ^b   Leskova, T A ^c   Maradudin, A A ^d  

^a FEDERAL UNIVERSITY OF GOIÁS   (Brazil)

^b UNIVERSITY OF MÜNSTER   (Germany)

^c INSTITUTE OF SPECTROSCOPY   (Russian Federation)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Inverse problem; Near field optics; Scattering; Surface plasmon polaritons; Surface roughness

Indexed keywords

FOURIER TRANSFORMS; OPTICAL MICROSCOPY; SURFACE ROUGHNESS; SURFACE WAVES;

NEAR-FIELD OPTICAL SCANNING MICROSCOPY; SURFACE PLASMON POLARITONS;

LIGHT SCATTERING;

EID: 0032181629     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(98)00383-6     Document Type: Article

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