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Volumn 37, Issue 10, 1998, Pages 5823-5834
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Thermo-flow structure and epitaxial uniformity in large-scale metalorganic chemical vapor deposition reactors with rotating susceptor and inlet flow control
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Author keywords
Epitaxial uniformity; Fluid dynamics; Heat and mass transfer; III V semiconductors; Inlet flow control; MOCVD process; Rotating susceptor
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Indexed keywords
EPITAXIAL GROWTH;
FILM GROWTH;
FLOW CONTROL;
FLUID DYNAMICS;
HEAT TRANSFER;
MASS TRANSFER;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
ROTATIONAL FLOW;
SEMICONDUCTING GALLIUM ARSENIDE;
THIN FILMS;
TRANSPORT PROPERTIES;
VORTEX FLOW;
ROTATING SUSCEPTORS;
CHEMICAL REACTORS;
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EID: 0032180666
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.37.5823 Document Type: Article |
Times cited : (28)
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References (14)
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