Infrared spectroscopic studies on the molecular orientation of vacuum-deposited thin films of poly(dimethylsilane) and a linear oligosilane

Macromolecules

Volumn 31, Issue 21, 1998, Pages 7483-7487

  Shimomura, Masaki ^a   Okumoto, Hajime ^a   Kaito, Akira ^a   Ueno, Katsuhiko ^a   Shen, Jingshu ^b   Ito, Kohzo ^c  

^a NATL INST OF MAT AND CHEM RES   (Japan)

^b INSTITUTE OF CHEMISTRY   (China)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DEPOSITION; INFRARED SPECTROSCOPY; LIGHT ABSORPTION; MOLECULAR ORIENTATION; MOLECULES; POLYSILANES; ULTRAVIOLET SPECTROSCOPY; VACUUM APPLICATIONS;

DICHROISM; PERMETHYLDODECASILANE; POLYDIMETHYLSILANE;

THIN FILMS;

EID: 0032180093     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma980235j     Document Type: Article

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