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Volumn 89, Issue 10, 1998, Pages 672-677

Properties of vacancies in copper determined by electrical resistivity techniques

(1)  Schüle, Wolfgang a,b  

b NONE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; POINT DEFECTS; POLYNOMIALS;

EID: 0032179982     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (16)

References (22)
  • 9
    • 4243612522 scopus 로고    scopus 로고
    • D. S. Gelles, R. K. Nanstad, A. S. Kumar, E. A. Little (eds) Sun Valley, Idaho, USA, June 22-26, 1994, ASTM, Philadelphia, ASTM STP 1270
    • th International Symposium on the Effects of Radiation on Materials, Sun Valley, Idaho, USA, June 22-26, 1994, ASTM, Philadelphia, ASTM STP 1270 (1996) 874.
    • (1996) th International Symposium on the Effects of Radiation on Materials , pp. 874
    • Schüle, W.1
  • 10
    • 0030263919 scopus 로고    scopus 로고
    • V. M. Chernov, W. M. Gauster, D. S. Gelles, A. B. Hull, R. L. Klueh, H. Stamm (eds). Seventh International Conference on Fusion Reactor Materials (ICFRM-7). Obninsk, Kaluga Region, Russia September 25-29, 1995
    • Schule, W.: in: V. M. Chernov, W. M. Gauster, D. S. Gelles, A. B. Hull, R. L. Klueh, H. Stamm (eds). Seventh International Conference on Fusion Reactor Materials (ICFRM-7). Obninsk, Kaluga Region, Russia September 25-29, 1995, J. Nucl. Mat. 233-237 (1996) 964.
    • (1996) J. Nucl. Mat. , vol.233-237 , pp. 964
    • Schule, W.1
  • 11
    • 11644311104 scopus 로고    scopus 로고
    • Schüle, W.: as Ref. [10] 969
    • Schüle, W.: as Ref. [10] 969.
  • 13
    • 0001878810 scopus 로고    scopus 로고
    • R. W. Cahn, P. Haasen (eds). North-Holland Physics Publishing, Elsevier Science B.V
    • Wollenberger, H. J.: in: R. W. Cahn, P. Haasen (eds). Physical Metallurgy, North-Holland Physics Publishing, Elsevier Science B.V (1996) 1621.
    • (1996) Physical Metallurgy , pp. 1621
    • Wollenberger, H.J.1
  • 17
    • 11644319233 scopus 로고    scopus 로고
    • Gieb, M.; Heieck, J.; Schule, W.: as Ref. [9] 874
    • Gieb, M.; Heieck, J.; Schule, W.: as Ref. [9] 874.
  • 18
    • 0004217211 scopus 로고
    • A. Seeger, D. Schumacher, W. Schilling, J. Diehl (eds), Jülich, Germany, September 23-28, 1968, North Holland Publication Company. Amsterdam
    • Wenzl, H.: in: A. Seeger, D. Schumacher, W. Schilling, J. Diehl (eds), Proc. of the International Conference on Vacancies and Interstitials in Metals, Jülich, Germany, September 23-28, 1968, North Holland Publication Company. Amsterdam (1970) 363.
    • (1970) Proc. of the International Conference on Vacancies and Interstitials in Metals , pp. 363
    • Wenzl, H.1
  • 20
    • 4243933002 scopus 로고
    • Arvind S. Kumar, David S. Gelles, Randy K. Nanstad, Edward A. Little (eds). Aurora, Colorado, USA, June 23-25, 1992, ASTM, Philadelphia, ASTM STP 1175
    • th International Symposium on Effects of Radiation on Materials, Aurora, Colorado, USA, June 23-25, 1992, ASTM, Philadelphia, ASTM STP 1175 (1994) 113.
    • (1994) th International Symposium on Effects of Radiation on Materials , pp. 113
    • Schüle, W.1
  • 21
    • 11644264915 scopus 로고    scopus 로고
    • to be published
    • Schüle, W.: to be published.
    • Schüle, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.