New Measurement-Based Technique for RF LDMOS Nonlinear Modeling

IEEE Microwave and Guided Wave Letters

Volumn 8, Issue 10, 1998, Pages 345-347

  Collantes, J M ^a   Raoux, J J ^b   Quere, R ^b   Suarez A ^c  

^a UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^b UNIVERSITY OF LIMOGES   (France)

^c UNIVERSITY OF CANTABRIA   (Spain)

Author keywords

Cubic B splines; LDMOS transistors; Look up table model; Nonlinear modeling

Indexed keywords

APPROXIMATION THEORY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; SEMICONDUCTOR DEVICE MODELS; TABLE LOOKUP; VOLTAGE MEASUREMENT;

CUBIC B-SPLINES; NONLINEAR MODELING;

MOSFET DEVICES;

EID: 0032179704     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.735416     Document Type: Article

References (6)

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