Chaos in MEMS, parameter estimation and its potential application

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 45, Issue 10, 1998, Pages 1013-1020

  Wang, Yongmei Cindy ^a   Adams, Scott G ^a   Thorp, James S ^a   MacDonald, Noel C ^a   Hartwell, Pete ^a   Bertsch, Fred ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHAOS THEORY; FLIP FLOP CIRCUITS; PARAMETER ESTIMATION; SECURITY OF DATA;

STRANGE ATTRACTOR;

MICROELECTROMECHANICAL DEVICES;

EID: 0032179599     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/81.728856     Document Type: Article

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