X-Ray fluorescence analysis by multiple-glancing x-ray beam excitation

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 10, 1998, Pages 5821-5822

  Tsuji, Kouichi ^a   Sato, Tasaku ^a   Wagatsuma, Kazuaki ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Glancing incidence; Glow discharge X ray tube; Multiple X ray beams; Surface analysis; Thin film; Total reflection X ray fluorescence

Indexed keywords

CHROMIUM; ELECTROMAGNETIC WAVE REFLECTION; EMISSION SPECTROSCOPY; FLUORESCENCE; GLOW DISCHARGES; METALLIC FILMS; THIN FILMS; X RAY ANALYSIS; X RAY TUBES;

MULTIPLE GLANCING X RAY BEAMS; X RAY FLUORESCENCE ANALYSIS;

X RAY SPECTROSCOPY;

EID: 0032179357     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.5821     Document Type: Article

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