Simultaneous measurement of size and electromagnetic property of multilayered spherical sample

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 5, 1998, Pages 1277-1282

  Yamazaki, Sadao ^b   Nakane, Hiroshi ^a,b   Negishi, Teruo ^b   Tanaka, Akio ^c  

^a IEEE

^b KOGAKUIN UNIVERSITY   (Japan)

^c UBE NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

Detection of foreign matter; Double layered spherical conductor; Impedance measurement; Nondestructive test; Solenoid coil

Indexed keywords

CONDUCTIVE MATERIALS; ELECTRIC IMPEDANCE MEASUREMENT; ELECTROMAGNETIC FIELDS; IMPURITIES; MEATS; NONDESTRUCTIVE EXAMINATION; SOLENOIDS;

ELECTROMAGNETIC PROPERTIES;

ELECTRIC CONDUCTIVITY MEASUREMENT;

EID: 0032178590     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.746597     Document Type: Article

References (1)

1. S. Yamazaki, T. Negishi, H. Nakane, and A. Tanaka, "Simultaneous measurement of electric and magnetic properties of a spherical sample," IEEE Trans. Instrum. Meas., vol. 45, pp. 473-477, Apr. 1996.