Control of Particulate Processes by Optical Measurement Techniques

Particle and Particle Systems Characterization

Volumn 15, Issue 5, 1998, Pages 211-218

  Heffels, Camiel ^a   Polke, Reinhard ^a   Rädle, Matthias ^a   Sachweh, Bernd ^a   Schäfer, Michael ^a   Scholz, Norbert ^a  

^a BASF SE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL SENSORS; OPTICAL VARIABLES MEASUREMENT; PROCESS CONTROL;

PARTICLE CHARACTERIZATION;

PARTICLES (PARTICULATE MATTER);

EID: 0032178497     PISSN: 09340866     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4117(199810)15:5<211::AID-PPSC211>3.0.CO;2-H     Document Type: Article

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