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Volumn 17, Issue 19, 1998, Pages 1605-1607

Surface modification of CrSi2 nanocrystals with polymer coating

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; COATED MATERIALS; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; ORGANIC POLYMERS; RAMAN SPECTROSCOPY; SURFACE TREATMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0032178305     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006592516410     Document Type: Article
Times cited : (5)

References (13)
  • 2
    • 0001851087 scopus 로고
    • edited by F. E. Fujita Springer-Verlag, Berlin
    • R. W. SIEGEL, in "Physics of new materials", edited by F. E. Fujita (Springer-Verlag, Berlin, 1994) pp. 65-105.
    • (1994) Physics of New Materials , pp. 65-105
    • Siegel, R.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.