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Volumn 17, Issue 19, 1998, Pages 1685-1687

Stoichiometric and dielectric properties of BaTiO3 thin films prepared by backside pulsed ion-beam evaporation

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM TITANATE; DIELECTRIC PROPERTIES; EVAPORATION; FILM PREPARATION; LASER PULSES; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; TEMPERATURE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032178299     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006699625013     Document Type: Article
Times cited : (10)

References (18)
  • 11
    • 0028460918 scopus 로고
    • X. D. KANG, K. MASUGATA and K. YATSUI, Jpn. J. Appl. Phys. 33 (1994) 1155; Ibid. 33 (1994) L1041.
    • (1994) Jpn. J. Appl. Phys. , vol.33


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.