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Volumn 45, Issue 10, 1998, Pages 905-908

Temperature dependence of the thermoelectric properties of Si doped SiC

Author keywords

Figure of merit; SiC; Thermoelectric material

Indexed keywords

DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY MEASUREMENT; POWDER METALS; SILICON; THERMAL CONDUCTIVITY OF SOLIDS; X RAY CRYSTALLOGRAPHY;

EID: 0032178126     PISSN: 05328799     EISSN: None     Source Type: Journal    
DOI: 10.2497/jjspm.45.905     Document Type: Article
Times cited : (6)

References (12)
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  • 3
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    • SiC
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    • (1986) Yogyo-Kyokai-Shi , vol.94 , pp. 219
    • Okano, K.1
  • 5
    • 0348159522 scopus 로고
    • Thermoelectric conversion efficiency of porous SiC improved by microstructure regulation
    • Yokohama, Japan
    • W.S. Seo, K. Watari and K. Koumoto: "Thermoelectric conversion efficiency of porous SiC improved by microstructure regulation", Proc. 12th Int. Conf. on Thermoelectrics (ICT'93), Yokohama, Japan, (1993)175.
    • (1993) Proc. 12th Int. Conf. on Thermoelectrics (ICT'93) , pp. 175
    • Seo, W.S.1    Watari, K.2    Koumoto, K.3
  • 7
    • 0348159520 scopus 로고    scopus 로고
    • Thermoelectric Properties of SiC/Ag System at room temperature
    • K. Kato, S. Tanaka, Y. Okamoto and J. Morimoto: "Thermoelectric Properties of SiC/Ag System at room temperature ", Mem. Natl. Def. Acad., 37(1997)1.
    • (1997) Mem. Natl. Def. Acad. , vol.37 , pp. 1
    • Kato, K.1    Tanaka, S.2    Okamoto, Y.3    Morimoto, J.4
  • 8
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    • The characteristics of high temperature thermoelectric material: Sintered SiC/Cu
    • submitted
    • Y. Okamoto, K. Kato, K. Asai, J. Morimoto and T. Miyakawa: "The characteristics of high temperature thermoelectric material: sintered SiC/Cu", submitted in J. Matr. Sci.
    • J. Matr. Sci.
    • Okamoto, Y.1    Kato, K.2    Asai, K.3    Morimoto, J.4    Miyakawa, T.5
  • 9
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    • A study for Thermoelectric Properties of Ni Doped SiC Sintered Thermoelectric Semiconductor
    • Y. Okamoto and K. Kato: "A study for Thermoelectric Properties of Ni Doped SiC Sintered Thermoelectric Semiconductor", Mem. Natl. Def. Acad., 37(1997)15.
    • (1997) Mem. Natl. Def. Acad. , vol.37 , pp. 15
    • Okamoto, Y.1    Kato, K.2
  • 11
    • 84957270370 scopus 로고
    • Thermal Diffusivity of Semiconductors Evaluated by Differential PPE Method
    • J. Morimoto, Y. Okamoto and T. Miyakawa: "Thermal Diffusivity of Semiconductors Evaluated by Differential PPE Method", Jpn. J. Appl. Phys., 31 Suppl. 31-1(1992)38.
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    • Morimoto, J.1    Okamoto, Y.2    Miyakawa, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.