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Volumn 6, Issue 10-12, 1999, Pages 719-725

Bit error rate experiments in ring-shaped RSFQ circuits

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT LAYOUT; JOSEPHSON JUNCTION DEVICES; MULTIPLYING CIRCUITS; RELIABILITY; TUNNEL JUNCTIONS;

EID: 0032173950     PISSN: 09641807     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0964-1807(99)00034-4     Document Type: Article
Times cited : (3)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.