Improvements in the reconstruction of in-line holograms by energy sampling and tomography

Ultramicroscopy

Volumn 74, Issue 4, 1998, Pages 169-178

  Shegelski, Mark R A ^a   Faltus, Silas ^a   Clark, Thomas ^a   Kreuzer, H J ^b  

^a UNIVERSITY OF NORTHERN BRITISH COLUMBIA   (Canada)

^b DALHOUSIE UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPES; ELECTRON SCATTERING; IMAGE RECONSTRUCTION; OPTICAL RESOLVING POWER; TOMOGRAPHY;

ENERGY SAMPLING; KIRCHHOFF-HELMHOLTZ RECONSTRUCTION INTEGRAL; LOW ENERGY ELECTRON POINT SOURCE (LEEPS) MICROSCOPY;

HOLOGRAMS;

HOLOGRAPHY; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; MATHEMATICAL ANALYSIS; REVIEW; TOMOGRAPHY;

EID: 0032170403     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00036-9     Document Type: Article

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