Common due window size and location determination in a single machine scheduling problem

Journal of the Operational Research Society

Volumn 49, Issue 9, 1998, Pages 1007-1010

  Liman, S D ^a   Panwalkar, S S ^a   Thongmee, S ^b  

^a TEXAS TECH UNIVERSITY   (United States)

^b i2 Technologies   (United States)

Author keywords

Due window; Earliness tardiness; Just in time; Scheduling; Sequencing

Indexed keywords

ALGORITHMS; COST EFFECTIVENESS; CRITICAL PATH ANALYSIS; PERT; PROBLEM SOLVING; PROCESS CONTROL; SCHEDULING;

EARLINESS-TARDINESS PENALTIES;

JUST IN TIME PRODUCTION;

EID: 0032167289     PISSN: 01605682     EISSN: 14769360     Source Type: Journal    
DOI: 10.1057/palgrave.jors.2600601     Document Type: Article

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