KRXPS study of the oxidation of Ge(001) surface

Applied Surface Science

Volumn 134, Issue 1-4, 1998, Pages 275-282

  Tabet, Nouar A ^a   Salim, Mushtaq A ^a  

^a KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS   (Saudi Arabia)

Author keywords

Ge oxidation; Semiconductor surface; XPS

Indexed keywords

DECOMPOSITION; ETCHING; OXIDATION; OXIDES; OXYGEN; SEMICONDUCTOR GROWTH; X RAY PHOTOELECTRON SPECTROSCOPY;

GERMANIUM OXIDES; KINETIC RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY (KRXPS);

SEMICONDUCTING GERMANIUM;

EID: 0032167268     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00251-7     Document Type: Article

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