Dynamic SIMS study of Cr 3 C 2 , Cr 7 C 3 and Cr 23 C 6

Applied Surface Science

Volumn 134, Issue 1-4, 1998, Pages 194-196

  Salaita, Ghaleb N ^a   Hoflund, Gar B ^b  

^a UNION CARBIDE CORPORATION   (United States)

^b University of Florida   (United States)

Author keywords

Chromium carbides; Cr 3 C 2 , Cr 7 C 3 , Cr 23 C 6; Dynamic SIMS; Secondary ion mass spectrometry

Indexed keywords

CHROMIUM COMPOUNDS; NEGATIVE IONS; POSITIVE IONS; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; STOICHIOMETRY; SURFACE STRUCTURE;

CHROMIUM CARBIDES;

CARBIDES;

EID: 0032167032     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00246-3     Document Type: Article

References (6)

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5. G.N. Salaita, G.B. Hoflund, S. Hoshino, in: G. Gillen, R. Lareau, J. Bennett, F. Stevie, (Eds.) Secondary Ion Mass Spectrometry (SIMS XI), Proceedings of the 11th International Conference on SIMS, Wiley, Chichester, 1998, pp. 867.
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