Thiophene adsorption on Pd(111) and Pd(100) surfaces studied by total-reflection S K-edge X-ray absorption fine-structure spectroscopy

Surface Science

Volumn 414, Issue 1-2, 1998, Pages 107-117

  Terada, S ^a   Yokoyama, T ^a   Sakano, M ^a   Imanishi, A ^a   Kitajima, Y ^b   Kiguchi, M ^a   Okamoto, Y ^a   Ohta, T ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

Aromatics; Chemisorption; Low index single crystal surfaces; Near edge extended X ray absorption fine structure (NEXAFS); Palladium; Surface extended X ray absorption fine structure (SEXAFS); Surface structure; Thiophene

Indexed keywords

ABSORPTION SPECTROSCOPY; ADSORPTION; CHARGE TRANSFER; CHEMICAL BONDS; CRYSTAL ORIENTATION; ELECTRONIC PROPERTIES; MOLECULAR STRUCTURE; MONOLAYERS; SINGLE CRYSTALS; SULFUR COMPOUNDS; SURFACE STRUCTURE; X RAY SPECTROGRAPHS;

LOW INDEX SINGLE CRYSTALS; NEAR-EDGE EXTENDED X RAY-ABSORPTION FINE STRUCTURE (NEXAFS); SURFACE EXTENDED X RAY ABSORPTION FINE STRUCTURE (SEXAFS); THIOPHENE;

PALLADIUM;

EID: 0032166030     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00495-6     Document Type: Article

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