Atomic structure of two-dimensional Ag layer grown on Si(001)-(2 × 1) at room temperature

Surface Science

Volumn 414, Issue 1-2, 1998, Pages

  Park, N G ^a   Kim, Y W ^a   Cho, W S ^a   Kim, J Y ^a   Choi, D S ^b   Jeong, K ^a   Chae, K H ^a   Whang, C N ^a  

^a Yonsei University   (South Korea)

^b Kangwon National University   (South Korea)

Author keywords

Low energy ion scattering (LEIS); Silicon; Silver; Surface structure

Indexed keywords

CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; DIMERS; FILM GROWTH; MONOLAYERS; SILICON; SILVER; SPECTROSCOPIC ANALYSIS; SURFACE STRUCTURE;

COAXIAL IMPACT COLLISION ION SCATTERING SPECTROSCOPY;

METALLIC FILMS;

EID: 0032166029     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00546-9     Document Type: Article

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