Low energy He+ ion scattering from HfB2(0001), TaB2(0001), WB2(0001), YB4(001), and YB66(001) surfaces

Surface Science

Volumn 414, Issue 1-2, 1998, Pages 77-84

  Souda, R ^a   Asari, E ^a   Kawanowa, H ^a   Otani, S ^a   Tanaka, T ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Low energy ion scattering (LEIS); Low index single crystal surfaces; Metallic surfaces; Single crystal surfaces; Sputtering; Surface segregation; Surface structure, morphology, roughness, and topography

Indexed keywords

CRYSTAL ORIENTATION; HAFNIUM COMPOUNDS; HELIUM; ION BOMBARDMENT; MORPHOLOGY; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS; SPUTTERING; SURFACE ROUGHNESS; TANTALUM COMPOUNDS; TUNGSTEN COMPOUNDS; YTTRIUM COMPOUNDS;

LOW ENERGY ION SCATTERING (LEIS); LOW INDEX SINGLE CRYSTALS;

BORON COMPOUNDS;

EID: 0032165547     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00470-1     Document Type: Article

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