High-resolution imaging of n-alkane crystals by atomic force microscopy

Philosophical Magazine Letters

Volumn 78, Issue 3, 1998, Pages 255-261

  Valdre G ^a   Allessandrini, A ^a   Muscatello, U ^b   Valdre U ^a  

^a INFM   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; GRAPHITE; HIGH RESOLUTION ELECTRON MICROSCOPY; MICA; MOLECULAR STRUCTURE; SUBSTRATES; VAPOR DEPOSITION; X RAY CRYSTALLOGRAPHY;

ELECTRON CRYSTALLOGRAPHY;

PARAFFINS;

EID: 0032165309     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008398178011     Document Type: Article

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