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Volumn 154, Issue 4, 1998, Pages 225-233
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Z-scan with arbitrary aperture transmittance: The strongly nonlinear regime
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Author keywords
[No Author keywords available]
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Indexed keywords
MATHEMATICAL MODELS;
NONLINEAR OPTICS;
OPACITY;
OPTICAL VARIABLES MEASUREMENT;
SCANNING;
REFRACTORS;
Z-SCAN MEASUREMENTS;
LIGHT PROPAGATION;
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EID: 0032165279
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(98)00287-9 Document Type: Article |
Times cited : (17)
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References (11)
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