Integrated reflectometer-interferometer system for plasma density profile measurement

Plasma Physics and Controlled Fusion

Volumn 40, Issue 9, 1998, Pages 1575-1584

  Brower, D L ^a   Kim, K W ^a   Zeng, L ^a   Jiang, Y ^a   Doyle, E J ^a   Peebles, W A ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA PROCESSING; ELECTRON DENSITY MEASUREMENT; INTERFEROMETERS; OPTIMIZATION; PLASMA DENSITY; REFLECTOMETERS;

PLASMA DENSITY PROFILES;

PLASMA DIAGNOSTICS;

EID: 0032164878     PISSN: 07413335     EISSN: None     Source Type: Journal    
DOI: 10.1088/0741-3335/40/9/002     Document Type: Article

References (7)

1. Kim S K, Brower D L, Peebles W A and Luhmann N C Jr 1988 Rev. Sci. Instrum. 59 1550-5
2. Brower D L, Jiang Y, Peebles W A, Burns S and Luhmann N C Jr 1992 Rev. Sci. Instrum. 63 4990
3. Brower D L and Jiang Y 1995 Rev. Sci. Instrum. 66 856
4. Jiang Y, Brower D L, Zeng L and Howard J 1997 Rev. Sci. Instrum. 68 902
5. Kim K W, Doyle E J, Rhodes T L, Peebles W A, Rettig C L and Luhmann N C Jr 1997 Rev. Sci. Instrum. 68 466
6. Li W L et al 1990 Rev. Sci. Instrum. 61 2852
7. Snider R T, Carlstrom T N, Hodapp T D, Jobes F C and Peebles W A 1997 Rev. Sci. Instrum. 68 728-31