Influence of electron scattering on current instability in field effect transistors

Solid-State Electronics

Volumn 42, Issue 9, 1998, Pages 1737-1742

  Cheremisin, M V ^a,b   Dyakonov, M I ^a,c   Shur, M S ^c   Samsonidze, G ^a  

^a IOFFE INSTITUTE   (Russian Federation)

^b UNIV MONTPELLIER   (France)

^c RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CHARGE CARRIERS; COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRON SCATTERING; PLASMA WAVES;

CURRENT INSTABILITY;

FIELD EFFECT TRANSISTORS;

EID: 0032164680     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00133-6     Document Type: Article

References (8)

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