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Volumn 8, Issue 3, 1998, Pages 243-249

Buckling of polysilicon microbeams during sacrificial layer removal

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; BUCKLING; ETCHING; MICROFORMS; POLYSILANES; RESIDUAL STRESSES; SILICONES;

EID: 0032164543     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/8/3/011     Document Type: Article
Times cited : (26)

References (6)
  • 1
    • 0024031832 scopus 로고
    • Integrated movable micromechanical structures for sensors and actuators
    • Fan L S, Tai Y-C and Muller R S 1988 Integrated movable micromechanical structures for sensors and actuators IEEE Trans. Electron Devices ED-35 724-30
    • (1988) IEEE Trans. Electron Devices , vol.ED-35 , pp. 724-730
    • Fan, L.S.1    Tai, Y.-C.2    Muller, R.S.3
  • 2
    • 0026815322 scopus 로고
    • Growth and configurational stability of circular, buckling-driven film delaminations
    • Hutchinson J W, Thouless M D and Liniger E G 1992 Growth and configurational stability of circular, buckling-driven film delaminations Acta Metall. Mater. 40 295-308
    • (1992) Acta Metall. Mater. , vol.40 , pp. 295-308
    • Hutchinson, J.W.1    Thouless, M.D.2    Liniger, E.G.3
  • 4
    • 0026960770 scopus 로고
    • A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films
    • Vlassak J J and Nix W D 1992 A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films J. Mater. Res. 7 3242-9
    • (1992) J. Mater. Res. , vol.7 , pp. 3242-3249
    • Vlassak, J.J.1    Nix, W.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.